Widely used in electronics, motors, communications, electroplating, plastics, hardware chemical, food, printing, pharmaceutical, PC board, powder, including immersion, spraying, glass, ceramics, wood building materials and other items precision baking, drying, tempering, preheating, shaping, processing
Widely used in electronics, motors, communications, electroplating, plastics, hardware chemical, food, printing, pharmaceutical, PC board, powder, including immersion, spraying, glass, ceramics, wood building materials and other items precision baking, drying, tempering, preheating, shaping, processing
It is used in various chemical, biological, pharmaceutical, scientific research, agriculture, environmental testing and other research fields; for powder drying, drying heat-sensitive, easily decomposed, and easily oxidized substances
The Xenon Lamp Test Chamber Adopts The Xenon Arc Lamp Which Can Simulate The Full Sunlight Spectrum To Reproduce The Destructive Light Waves Existing In Different Environments, And Can Provide Corresponding Environmental Simulation And Accelerated Tests For Scientific Research, Product Development And Quality Control. The Xenon Arc Test Chamber Can Be Used For The Selection Of New Materials, The Improvement Of Existing Materials, Or The Change Test Of Durability After Evaluating The Composition Of Materials. It Can Well Simulate The Changes Of Materials Exposed To Sunlight Under Different Environmental Conditions.
HAST Highly Accelerated Aging Tester (also known as HAST High Pressure Accelerated Aging Tester) The purpose of the test is to increase environmental stress (such as temperature) and working stress (voltage, load, etc. applied to the product), speed up the test process, and shorten the product or system The life test time is used to investigate and analyze when the problems of wear and service life of electronic components and mechanical parts occur, what is the shape of the failure distribution function of the service life, and the test to analyze the reasons for the increase in failure rate .
Standards: IEC60068-2-66, JESDEC-A110, A118, IEC60068-2-66, JESDEC A110, A118