Park Nano-IR Spectrometers

AFM-integrated nanoscale IR spectroscopy ​for advanced material characterization 

Park nano-IR spectrometers seamlessly integrate atomic force microscopy (AFM) with photo-induced force microscopy (PiFM) technology. These innovative platforms deliver molecular vibration mapping at the nanometer scale while maintaining full AFM capabilities for comprehensive topographic, nanomechanical, electrical, and thermal analysis.

With simultaneous acquisition of nano-IR chemical information and surface topography, Park nano-IR spectrometers are ideal for nanoscale IR spectroscopy and imaging in semiconductors, polymers, thin films, 2D materials, and other advanced materials.